首页 正文

IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2013;21(2):292-305. doi: 10.1109/TVLSI.2012.2185524 Q23.22025

System-Level Modeling and Analysis of Thermal Effects in Optical Networks-on-Chip

Ye, Yaoyao; Xu, Jiang; Wu, Xiaowen; Zhang, Wei; Wang, Xuan; Nikdast, Mahdi; Wang, Zhehui; Liu, Weichen

DOI: 10.1109/TVLSI.2012.2185524

摘要 查看摘要

Copyright © IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 中文内容为AI机器翻译,仅供参考!

期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

文章目录 更多期刊信息

全文链接
引文链接
复制
已复制!
推荐内容
System-Level Modeling and Analysis of Thermal Effects in Optical Networks-on-Chip