Ieee transactions on very large scale integration (vlsi) systems. 1998;6(1):39-42. doi: 10.1109/92.661243 Q23.22025
Sampling phase detector using a resonant tunneling high electron mobility transistor for microwave phase-locked oscillators
DOI: 10.1109/92.661243
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期刊名：Ieee transactions on very large scale integration (vlsi) systems
缩写：IEEE T VLSI SYST
ISSN：1063-8210
e-ISSN：1557-9999
IF/分区：3.2/Q2
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Sampling phase detector using a resonant tunneling high electron mobility transistor for microwave phase-locked oscillators