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Ieee transactions on very large scale integration (vlsi) systems. 2011;19(2):237-249. doi: 10.1109/tvlsi.2009.2033699 Q23.22025

Dynamic Characteristics of Power Gating During Mode Transition

Hao Xu; Vemuri, R.; Jone, W.

DOI: 10.1109/tvlsi.2009.2033699

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期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

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Dynamic Characteristics of Power Gating During Mode Transition