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Ieee transactions on very large scale integration (vlsi) systems. 2002;10(6):876-885. doi: 10.1109/tvlsi.2002.808436 Q23.22025

Leakage power analysis and reduction during behavioral synthesis

行为综合过程中的功耗泄漏分析与降低

Khouri, K.S.; Jha, N.K.

DOI: 10.1109/tvlsi.2002.808436

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期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

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Leakage power analysis and reduction during behavioral synthesis