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Ieee transactions on reliability. 1995;44(1):120-127. doi: 10.1109/24.376531 Q15.72025

Survey of reliability studies of consecutive-k-out-of-n:F and related systems

Chao, M.T.; Fu, J.C.; Koutras, M.V.

DOI: 10.1109/24.376531

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期刊名:Ieee transactions on reliability

缩写:IEEE T RELIAB

ISSN:0018-9529

e-ISSN:1558-1721

IF/分区:5.7/Q1

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Survey of reliability studies of consecutive-k-out-of-n:F and related systems