Ieee transactions on reliability. 1988;37(3):299-307. doi: 10.1109/24.3759 Q15.72025
Failure rate of a cold- or hot-spared component with a lognormal lifetime
DOI: 10.1109/24.3759
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Ieee transactions on reliability. 1988;37(3):299-307. doi: 10.1109/24.3759 Q15.72025
DOI: 10.1109/24.3759
摘要 查看摘要