Quality and reliability engineering international. 1993;9(5):401-405. doi: 10.1002/qre.4680090503 Q22.82025

Correlation between EMI-induced failures and large-signal response of fet-input opamps

D. Golzio; S. Graffi; Zs. M. V.-Kovács; G. Masetti

DOI: 10.1002/qre.4680090503

摘要

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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