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Quality and reliability engineering international. 1993;9(4):398-398. doi: 10.1002/qre.4680090433 Q22.82025

Estimating device reliability: Assessment of credibility, Franklin R. Nash, Kluwer Academic Publishers, 1993. Number of pages: 213

P. D. T. O'Connor

DOI: 10.1002/qre.4680090433

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期刊名:Quality and reliability engineering international

缩写:QUAL RELIAB ENG INT

ISSN:0748-8017

e-ISSN:1099-1638

IF/分区:2.8/Q2

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Estimating device reliability: Assessment of credibility, Franklin R. Nash, Kluwer Academic Publishers, 1993. Number of pages: 213