Quality and reliability engineering international. 1993;9(4):303-308. doi: 10.1002/qre.4680090411 Q22.82025

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

W. Claeys; S. Dilhaire; V. Quintard; J. P. Dom; Y. Danto

DOI: 10.1002/qre.4680090411

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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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