Quality and reliability engineering international. 1993;9(2):143-147. doi: 10.1002/qre.4680090212 Q22.82025

A comparative reliability assessment of 750nm, 1060nm and 1300nm high power surface light emitting diodes

C. E. Lindsay

DOI: 10.1002/qre.4680090212

摘要

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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