Quality and reliability engineering international. 1993;9(2):95-104. doi: 10.1002/qre.4680090206 Q22.82025

A computer-controlled environmental test system for high pin-count integrated circuit packages

John Barrett; John Ó Donavan; Thomas Hayes; Seán C.Ó Mathúna

DOI: 10.1002/qre.4680090206

摘要

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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