Quality and reliability engineering international. 1993;9(1):80-80. doi: 10.1002/qre.4680090121 Q22.82025

VLSI reliability, Anant G. Sabnis. Vol. 22 of the series VLSI Electronics Microstructure Science, Academic Press 1990. Number of pages: 207. Price: $85.00

Finn Jensen

DOI: 10.1002/qre.4680090121

摘要

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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