Quality and reliability engineering international. 1987;3(4):251-258. doi: 10.1002/qre.4680030407 Q22.82025

The organization of a study of the field failure of electronic components

D. S. Campbell; J. A. Hayes; D. R. Hetherington

DOI: 10.1002/qre.4680030407

摘要

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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