Quality and reliability engineering international. 2012;aop(aop):-. doi: 10.1002/qre.1426 Q22.82025

The Use of Probability Limits of COM–Poisson Charts and their Applications

Aamir Saghir; Zhengyan Lin; Saddam Akber Abbasi; Shabbir Ahmad

DOI: 10.1002/qre.1426

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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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