Journal of nondestructive evaluation. 2009;28(3-4):125-130. doi: 10.1007/s10921-009-0054-8 Q22.42025

Structural Properties of Doped GaN on Si(111) Studied by X-Ray Diffraction Techniques

X射线衍射技术研究Si（111）上掺杂GaN的结构特性

DOI: 10.1007/s10921-009-0054-8

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