首页 正文

Journal of materials science-materials in electronics. 2008;19(2):189-193. doi: 10.1007/s10854-007-9298-1 Q23.22025

High temperature assessment of nitride-based devices

氮化物基器件的高温评估

R. Cuerdo; J. Pedrós; A. Navarro; A. F. Braña; J. L. Pau; E. Muñoz; F. Calle

DOI: 10.1007/s10854-007-9298-1

摘要 查看摘要

Copyright © . 中文内容为AI机器翻译,仅供参考!

期刊名:Journal of materials science-materials in electronics

缩写:J MATER SCI-MATER EL

ISSN:0957-4522

e-ISSN:1573-482X

IF/分区:3.2/Q2

文章目录 更多期刊信息

全文链接
引文链接
复制
已复制!
推荐内容
High temperature assessment of nitride-based devices