Journal of materials science-materials in electronics. 2008;19(2):189-193. doi: 10.1007/s10854-007-9298-1 Q23.22025
High temperature assessment of nitride-based devices
氮化物基器件的高温评估
DOI: 10.1007/s10854-007-9298-1
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Journal of materials science-materials in electronics. 2008;19(2):189-193. doi: 10.1007/s10854-007-9298-1 Q23.22025
DOI: 10.1007/s10854-007-9298-1
摘要 查看摘要