International journal of numerical modelling-electronic networks devices and fields. 1988;1(1):19-30. doi: 10.1002/jnm.1660010105 Q21.72025
Two-dimensional numerical simulation of short-gate-length gaAs MESFETs and application to the travelling gunn domain phenomenon
DOI: 10.1002/jnm.1660010105
摘要
期刊名:International journal of numerical modelling-electronic networks devices and fields
缩写:INT J NUMER MODEL EL
ISSN:0894-3370
e-ISSN:1099-1204
IF/分区:1.7/Q2
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Two-dimensional numerical simulation of short-gate-length gaAs MESFETs and application to the travelling gunn domain phenomenon
