首页 正文

International Journal of Circuit Theory and Applications. 1996;24(1):111-120. doi: 10.1002/(sici)1097-007x(199601/02)24:1<111::aid-cta907>3.0.co;2-x Q31.62025

EVALUATION OF CNN TEMPLATE ROBUSTNESS TOWARDS VLSI IMPLEMENTATION

KINGET, PETER; STEYAERT, MICHIEL

DOI: 10.1002/(sici)1097-007x(199601/02)24:1<111::aid-cta907>3.0.co;2-x

摘要

Copyright © International Journal of Circuit Theory and Applications. 中文内容为AI机器翻译,仅供参考!

期刊名:International journal of circuit theory and applications

缩写:INT J CIRC THEOR APP

ISSN:0098-9886

e-ISSN:1097-007X

IF/分区:1.6/Q3

文章目录 更多期刊信息

全文链接
引文链接
复制
已复制!
推荐内容
EVALUATION OF CNN TEMPLATE ROBUSTNESS TOWARDS VLSI IMPLEMENTATION