International journal of circuit theory and applications. 2000;28(5):501-506. doi: 10.1002/1097-007x(200009/10)28:5<501::aid-cta116>3.0.co;2-f Q31.62025
Performance evaluation of the LP test algorithm for finding all solutions of piecewise-linear resistive circuits
DOI: 10.1002/1097-007x(200009/10)28:5<501::aid-cta116>3.0.co;2-f
摘要
