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Epitaxial Growth and Structural Characterization of PbTe Thin Films on CdTe(211)B: Evidence of a 180° Twisted Interface

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We report on the epitaxial growth of PbTe thin films on CdTe(211)-B substrates by molecular beam epitaxy and identify a unique interfacial relationship characterized by a 180° rotational offset about the [111] axis. High-resolution X-ray diffraction shows tha... ...