Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs
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This paper systematically investigates the thermal failure mechanisms of 14 nm Ferro-FinFETs using the TCAD tools, incorporating both Preisach and thermodynamic models. A comparative analysis under programming (+ 4 V, 100 ns) and erasing (- 4 V, 100 ns) condit... ...
