Effect of Rising Time on AC Stress-Induced Performance Degradation in a-ITGZO Thin-Film Transistors
{{output}}
In this study, we investigate the impact of rising time on alternating current (AC) stress-induced degradation in amorphous indium-tin-gallium-zinc oxide (a-ITGZO) TFTs through both experiments and simulations. When AC bias stresses with rising and falling tim... ...
