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Enhancing Charge-Emitting Shallow Traps in Metal Halide Perovskites by >100 Times by Surface Strain

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The low density of deep trapping defects in metal halide perovskites (MHPs) is essential for high-performance optoelectronic devices. Shallow traps in MHPs are speculated to enhance charges recombination lifetime. However, it is unknown about the shallow trap ... ...