Ionic structure, liquid-liquid phase transitions, x-ray diffraction, and x-ray Thomson scattering in shock-compressed liquid silicon in the 100-200 GPa regime
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Recent cutting-edge experiments have provided in situ structure characterization and measurements of the pressure (P), density (ρ[over ¯]), and temperature (T) of shock compressed silicon in the 100 GPa range of pressures and up to ∼10000K. We present first... ...
