Separating edges from microstructure in X-ray dark-field imaging: evolving and devolving perspectives via the X-ray Fokker-Planck equation
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A key contribution to X-ray dark-field (XDF) contrast is the diffusion of X-rays by sample structures smaller than the imaging system's spatial resolution; this is related to position-dependent small-angle X-ray scattering. However, some experimental XDF tech... ...
