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Plant phenomics (Washington, D.C.). 2024 Aug 28:6:0234. doi: 10.34133/plantphenomics.0234 Q17.62024

Deep Learning Methods Using Imagery from a Smartphone for Recognizing Sorghum Panicles and Counting Grains at a Plant Level

基于智能手机影像的高粱穗花和籽粒深度识别与计数方法研究 翻译改进

Gustavo N Santiago  1, Pedro H Cisdeli Magalhaes  1, Ana J P Carcedo  1, Lucia Marziotte  1, Laura Mayor  2, Ignacio A Ciampitti  1  3

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作者单位

  • 1 Department of Agronomy, Kansas State University, Manhattan, KS 66506, USA.
  • 2 Corteva Agriscience, Wamego, KS 66547, USA.
  • 3 Institute of Digital Agriculture and Advanced Analytics, Kansas State University, Manhattan, KS 66506, USA.
  • DOI: 10.34133/plantphenomics.0234 PMID: 39703938

    摘要 Ai翻译

    High-throughput phenotyping is the bottleneck for advancing field trait characterization and yield improvement in major field crops. Specifically for sorghum (Sorghum bicolor L.), rapid plant-level yield estimation is highly dependent on characterizing the number of grains within a panicle. In this context, the integration of computer vision and artificial intelligence algorithms with traditional field phenotyping can be a critical solution to reduce labor costs and time. Therefore, this study aims to improve sorghum panicle detection and grain number estimation from smartphone-capture images under field conditions. A preharvest benchmark dataset was collected at field scale (2023 season, Kansas, USA), with 648 images of sorghum panicles retrieved via smartphone device, and grain number counted. Each sorghum panicle image was manually labeled, and the images were augmented. Two models were trained using the Detectron2 and Yolov8 frameworks for detection and segmentation, with an average precision of 75% and 89%, respectively. For the grain number, 3 models were trained: MCNN (multiscale convolutional neural network), TCNN-Seed (two-column CNN-Seed), and Sorghum-Net (developed in this study). The Sorghum-Net model showed a mean absolute percentage error of 17%, surpassing the other models. Lastly, a simple equation was presented to relate the count from the model (using images from only one side of the panicle) to the field-derived observed number of grains per sorghum panicle. The resulting framework obtained an estimation of grain number with a 17% error. The proposed framework lays the foundation for the development of a more robust application to estimate sorghum yield using images from a smartphone at the plant level.

    Keywords:deep learning methods; smartphone imagery; sorghum panicles; grain counting

    Copyright © Plant phenomics (Washington, D.C.). 中文内容为AI机器翻译,仅供参考!

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    期刊名:Plant phenomics

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    ISSN:2643-6515

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    IF/分区:7.6/Q1

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