Through-the-glass spectroscopic ellipsometry for analysis of the optical structure of CdTe thin-film solar cells in the superstrate configuration
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The polycrystalline CdS/CdTe thin-film solar cell in the superstrate configuration has been studied by spectroscopic ellipsometry (SE) using glass side illumination whereby the reflection from the glass/film-stack interface is collected whereas that from the a... ...
