In Situ Atomic Force Microscopy Tracking of Nanoparticle Migration in Semicrystalline Polymers
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We present in situ tracking of silica nanoparticle (NP) migration from a poly(ethylene oxide) (PEO) melt into interlamellar region using in situ atomic force microscopy (AFM). Our results confirm the previous hypothesis that NPs migrate into the interlamellar ... ...