EBIT Observation of Ar Dielectronic Recombination Lines near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters
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Motivated by possible atomic origins of the unidentified emission line detected at 3.55-3.57 keV in a stacked spectrum of galaxy clusters, an electron beam ion trap (EBIT) was used to investigate the resonant dielectronic recombination (DR) process in highly c... ...
