Relation of Dielectric Constants and Chemical Structures of Low Dielectric Constant SiCOH Films Deposited by Using Octamethylcyclotetrasiloxane and Tetraethylorthosilicate Precursors
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In case of the conventional SiCOH films, a post-deposition process was used to make pores by vaporization of porogen (e.g., hydrocarbon) for decreasing the dielectric constant. However, the authors intended the deposition of the SiCOH films, which does not nee... ...
