Investigation of CuGaSe2/CuInSe2 double heterojunction interfaces grown by molecular beam epitaxy
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In-situ reflection high-energy electron diffraction (RHEED) observation and X-ray diffraction measurements were performed on heterojunction interfaces of CuGaSe2/CnInSe2/CuGaSe2 grown on GaAs (001) using migration-enhanced epitaxy. The streaky RHEED pattern an... ...
