Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique
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The preparation of transmission electron microscopy (TEM) and atom probe-field ion microscopy (AP-FIM) specimens from mechanically alloyed Ti-Cu-Ni-Sn powder has been explored. Applying the focused ion beam (FIB) based in situ lift-out technique, it has been d... ...
